Fizik

Prof. Dr. Muhammed Hasan ASLAN
Savunma Teknolojileri Anabilim Dalı

Muhammed Hasan ASLAN
Telefon
(262) 605 13 09
E-Posta
maslangtu.edu.tr
Ofis
L Blok, 204
Çalışma alanları
Optik Karekterizasyon (Fotolüminesans, UV-Vis Spektrometre)İnce film kaplama (Sol-gel yöntemiyle Spin-coater kullanarak Metal oksit malzemelerin cam ve Si-wafer üzerine kaplanması)

Journal Article

  1. Effect of CdCl2 TREATMENT of CdS FILMS ON CdTe/CdS SOLAR CELLS, W.Song, D.Mao, L.Feng, Y.Zhu, M.H.Aslan, R.T.Collins and j.U.Trefny, Mat. Res. Soc Symp. Proc. 1996 MRS
  2. SULFUR DIFFUSION İN POLYCRYSTALLINE THIN-FILM CdTe SOLAR CELLS, M.H.Aslan, W.Song, D.Mao, R.T.Collins, D.H.Levi, R.K.Ahrenkiel, S.C.Lindstrom ve M.B.Jhonson, Mat. Res. Soc. Proc. Vol. 485 1998, MRS
  3. DETECTOR BASED CALIBRATION OF SOLAR UV RADIOMETERSIN LABORATORY  ENVIRONMENTS WITH HIGH ACCURACY, Murat Durak, S.Eren San and M.Hasan Aslan, (Measurement, Vol. 37 (2005), p.213-217)
  4. SOL-GEL FABRICATION OF LITHIUM DOPED ZINC OXIDE THIN FILMS, A. Yavuz Oral, M. Hasan Aslan, Z. Banu Bahşi and Engin Başaran,  (Key Engineering Materials, Vols 264-268 (2004) p.415-418)
  5. MICROSTRUCTURAL AND OPTICAL STUDY OF ITO THIN FILMS PREPARED BY SOL-GEL METHOD, M. Hasan Aslan, A. Yavuz ORAL, Erkan Demirci and Engin Başaran (Key Engineering Materials, Vols 264-268 (2004) p.443-446)
  6. THE SOL-GEL-LIKE PREPARATION OF CU0.95ME0.05OX THIN FILMS AND THE STUDY OF THEIR MICROSTRUCTURES AND OPTICAL PROPERTIES, M.Hasan.Aslan, Ebru.Menşur, Engin.Başaran and A.Yavuz.Oral (Key Engineering Materials, Vols 264-268 (2004) p.573-576)
  7. THE PREPARATION OF C-AXIS ORIENTED ZINC-OXIDE THIN FILMS AND THE STUDY OF THEIR MICROSTRUCTURE AND OPTICAL PROPERTIES, M. H. Aslan, A. Y. Oral, E. Menşur, A. Gül and E. Başaran (Solar Energy Materials and Solar Cells, 82 (2004) 543-542)
  8. THE PREPARATION OF COPPER (II) OXIDE THIN FILMS AND THE STUDY OF THEIR MICROSTRUCTURES AND OPTICAL PROPERTIES, A.Y.Oral E.Menşur, M.H.Aslan and E.Başaran (Materials Chemistry and Physics, Vol. 83 (2004), p.140-144
  9. OPTICAL CHARACTERIZATION OF THE SILICON PHOTODIODES FOR THE ESTABLISHMENT OF NATIONAL RADIOMETRIC STANDARDS, Murat DURAK and M.Hasan Aslan (Optics and Laser Technology, Vol.36 (2004), p.223-227)
  10. A COMPERATIVE STUDY FOR PROFILING ULTRATHIN BORON LAYERS in Si E. Basaran, O. Addemir, M. H. Aslan and E. H. C. Parker (Cryst. Res. Technol. Vol. 38 (2003) p. 1037-1041)
  • Doktora: Colorado School of Mines, Fizik Bölümü, Colorado/A
  • Yüksek lisans: İstanbul Üniversitesi, Fizik Bölümü, Vezneciler/İS
  • Lisans: İstanbul Üniversitesi, Fizik Bölümü, Vezneciler/İS